thermal shock test chamber
Model: HTC520-II
Overview
This series of products is designed and manufactured according to user requirements, widely used in aerospace, aviation, electronics, IT industry, automotive, electrical products etc., to test the specimen's adaptation under the rapid ambient temperature changes and to provide reliability testing, product screening and more on the safety of electronic components.
Main technical parameters
1 Basket size: L 600 × W 600 × H 600mm
2 basket load: ≥30kg
3 temperature shock range: low temperature -55 ℃, high temperature +125 ℃
4 basket change time: ≤ 10s
5 specimen change, the temperature re-stabilize capability: ≤ 5min
6 Temperature range: low temperature box: the lowest temperature -70 ℃; high temperature box: the maximum temperature 200 ℃
7 temperature change rate:
a) cryogenic box: room temperature ～ -55℃, cooling rate ≥ 1.5℃ / min (full range, on average)
b) hyperthermal box: room temperature ～ +85℃, heating rate ≥ 2℃ / min (full range, on average).
8 temperature tolerance: temperature of the effective working chamber should not exceed the prescribed temperature by ±2℃. The temperature gradient around the specimen should not exceed 1 ℃/m, and the total temperature difference should not exceed 2.2℃.
9 Temperature fluctuation: ± 0.5℃
10 sensors: class A Pt100 sheathed platinum resistance
The technical conditions not specified in the above clauses shall meet the relevant requirements of GB/T 10589-2008 and GB/T 11158-2008, respectively.
